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The Behaviors And Characteristics Of Photoelectrons In The Sulfur Sensitized Silver Halide

Posted on:2004-04-18Degree:MasterType:Thesis
Country:ChinaCandidate:X D LuFull Text:PDF
GTID:2120360122961196Subject:Optics
Abstract/Summary:PDF Full Text Request
By microwave absorption and phase-sensitive measure technique, the decay behaviors of photoelectrons in the sulfur-sensitized silver halide emulsion have been measured, and the time-resolved spectrum of free-electrons and shallow-trapped electrons have been obtained. Through analyzing the time-resolved spectrum of the decay process of free-electrons, the effect of traps in the different conditions of sulfur-sensitized reaction, the relationships between sulfur-sensitized conditions and the effect of traps of the T-grains AgBrI emulsion and the time characteristics of the decay processes of free-electrons and the best sensitizing conditions have been discussed. By the time-resolved spectrum of the decay process of shallow-trapped electrons, the time characteristics of the decay processes of shallow-trapped electrons and the depths of different shallow traps have been studied. In addition, by contrast of the decay behaviors of photoelectrons in different emulsions, the influences of the types of different emulsions on the results of sulfur-sensitized reaction have been analyzed.Through analyzing the time-resolved spectrum of the decay process curves of free-electrons of T-grain AgBrI emulsion with the changes of sensitizing conditions, we obtained that the sensitizing conditions have a best value, the best sensitizing conditions decided by free-electron signals and shallow-trapped electrons are same and the transform sequence of the traps in sulfur-sensitized reaction is hole trap, shallow trap and deep trap. The first areas of the decay curves of free-electron signals have two different areas, and one is longer than the other. The first areas of the decay curves of shallow-trapped electron signals also have two different areas, and one will be changed with the changes of sulfur-sensitized conditions, but the other is stable with the changes of sulfur-sensitized conditions, which is the inherent traps in T-grain AgBrI emulsion. By contrast of the decay behaviors of photoelectrons in different emulsions,the differences of decay time of different emulsions are obvious, for example, cubic AgBrCl emulsion has a very short decay time and one decay area; T-grains AgBrI, emulsion has a long decay time and two decay areas but cubic AgCl emulsion has a very long decay time and three decay areas. Similarly, the shallowed-trapped electrons of different emulsions also have different first order decay areas. In addition, the depths of shallow traps have been calculated. In cubic AgBrCl emulsion, the range of shallow traps is 0.13ev-0.20ev; In T-grains AgBrI, emulsion is 0.25ev-0.28ev; In cubic AgCl emulsion is 0.23ev-0.29ev.
Keywords/Search Tags:silver halide, sulfur sensitization, photoelectron, microwave and phase-sensitive measure
PDF Full Text Request
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