| Evenness, cleanness and neatness are major indicators to measure the quality of raw silk, which play an important role in quality and export of silk products. At present, the Seriplane manual inspection is being used to test the evenness, cleanness and neatness of raw silk, which affects not only the objectivity and fairness of inspection, but also the efficiency and accuracy. In silk industry, it's urgent to find a kind of electronic testing equipment and experimental method for raw silk, which is objective and not affected by subjective factors.The electronic detection system for raw silk about above is being studied, mainly adopting capacitive sensor and photoelectric sensor. The domestic work about this has also made great progress but still not achieved a breakthrough in some of the key technologies. Our laboratory research is around the localization issues of the electronic test system for raw silk. This paper mainly discusses the electronic detection for raw silk evenness and the influencing factors of CV% (coefficient of variation) based on virtual instrument.In this study, the advanced virtual instrument technology and modern photoelectric-sensor technology are adopted. In addition, the improved laboratory-made dynamic size tester for raw silk and DAQ 6024E data acquisition card are used to collect data(voltage values)of the raw silk size, with LabVIEW programs to process and analyze the collected data. Comparing with the data acquired by the capacitive sensor is to confirm the feasibility of the photoelectric measurement. As whether the defects or the long diameter and short diameter of raw silk affect CV% is also analyzed. In further research, combined with the programs for detecting raw silk faults, the CompactRIO platform with FPGA (Field Programmable Gate Array) is used for one-spindle, high-speed, real-time detection and analysis, in order to establish the stability and reliability of the entire electronic detection system for raw silk.
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