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The Discussion Of Electronic Testing System Design For Raw Silk

Posted on:2010-09-05Degree:MasterType:Thesis
Country:ChinaCandidate:N QiFull Text:PDF
GTID:2121360275458798Subject:Textile Engineering
Abstract/Summary:PDF Full Text Request
With the development of the testing technology and the widespread of the testing manner,the study of electronic testing for raw silk was enhanced. The concept of the electronic testing for raw silk was firstly put forward by the international silk association in 1984.And the concept was brought forward again in the standard manual of raw silk in 1995 International silk association Brighton conference,which promote the development of the electronic inspection for raw silk.However some key technology was not making many breakthroughs,the electronic testing for raw silk was not progressing smoothly.In this thesis,the hardware and software of single-spindle,the general design programs of multi-spindles,the solutions and theories of the existing domestic and international electronic testing for raw silk were discussed and summarized to form a electronic testing system and develop a software package.The system was supported by development environment of Virtual Instrument,The thread guide bayonet and circuit frequency of SD-1(a kind of raw silk instrument) sensor were improved to make the information of the raw silk size and faults into the computer accurately by DAQ in hardware. As far as software was concerned,a special program was designed based on virtual instrument.Serials of information data(voltage values) of the raw silk size and faults was get by the measurement of several groups of raw silk with this system.The testing results of the raw silk size and faults were acquired by the analysis of the fluctuating information data of the raw silk size.And the results were also able to store or print with the style of testing report.
Keywords/Search Tags:Electronic testing system for raw silk, SD-1 dynamic raw silk size tester, Virtual Instrument, LabVIEW, General design
PDF Full Text Request
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