The Electronic Inspection System For Defects Of Raw Silk Based On CRIO

Chinese raw silk occupies the monopolistic resource-advantage in international market; however, in assessing the quality of raw silk, blackboard manual eye inspection is still being used for some main inspection items, which affects not only the fairness of inspection, but also the efficiency and accuracy. Therefore, the implementation of electronic inspection for raw silk has become an expected important event in silk industry. With the rapid development of modern electronic inspecting technology, as well as the popularity of high-speed loom, the electronic inspecting means of chemical fiber, cotton and wool industry have been upgraded all the time, therefore, silk industry is also keen to conduct impartial inspection objectively by using electronic equipments to inspect raw silk, which reduces the impact of human factors greatly.The electronic inspecting methods for defects of raw silk at home and abroad are discussed in the paper, and the progress that has been made is also summed. According to the technological features of our lab, a new electronic inspecting system for defects of raw silk is put forward.Modern photoelectric-sensor technology and advanced visual instrumental technology are used in the system, and LabVIEW software and CompactRIO hardware of NI (National Instrument) company are combined together to realize the electronic inspection for defects of raw silk. As for software, a set of complete distinguishing programs for defects of raw silk is programmed based on LabVIEW, including sorting programs, counting programs and generating report programs. In addition, a set of simulating programs for defects of raw silk is also programmed based on LabVIEW to check the correctness of distinguishing programs. As for hardware, improved SD-1 dynamic size tester for raw silk is connected with NI CompactRIO, and the programs in upper computer are downloaded into the real-time controller through internet communication. Through I/O module's SCXI (signal conditioning and conversion) which can directly connect with sensor and FPGA's collecting programs, the silk data in size sensor is transmitted into FPGA. Through RIO FPGA built-in corn data transmission mechanism, collected data is transmitted into real-time controller for real-time analyzing, off-line processing or data recording, and results are conserved in the non-volatile memory of real-time controller. Finally, conserved data is transmitted to the upper computer by FPGA interface for display and report generation. Performance tests for the system are conducted in the paper, including the stability, the accuracy, and the rapidity and so on. The test results prove that the system can basically realize fast, accurate, several spindles'on-line inspection and analysis for defects of raw silk.