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The Research And Application Of Terrestrial Laser Scanning Technology In Large Scale Digital Mapping

Posted on:2016-12-09Degree:MasterType:Thesis
Country:ChinaCandidate:G H LiFull Text:PDF
GTID:2180330476950869Subject:Surveying and mapping engineering
Abstract/Summary:PDF Full Text Request
Large scale digital map is one of the most essential and fundamental materials in engineering construction. In some occasions, practitioners could not get to some harsh environments in topographic survey, and the cost of other methods like aerial photogrammetry and remote sensing is quite high. Based on the above situation, the development of terrestrial laser scanning(TLS) technology provides a new method for topographic survey. Terrestrial laser scanning technology is a new method to acquire quite high rate sampling spatial data of object without being in contact with it. TLS technology has been effectively applied in many fields, including engineering survey, deformation monitoring, the protection of cultural relics and the 3D modeling of digital city. However, the standard for the application of TLS technology in large scale digital mapping is still imperfect, and this method needs to be further researched.Based on the review of TLS technology, in this paper we applied TLS technology and total station digital mapping technology in large scale mapping of Lantian Jiao Dai, and we analyzed the error sources and the precision of results. In order to improve the mapping precision, we adopted the least-square theory and distance error polynomial fitting model according to the theory of error. We accomplished the batch correcting of huge amounts of point cloud data based on java program. According to the experiment, we could conclusion that TLS technology can effectively fulfill the general demand of large scale mapping, and the application of least-square theory and distance error polynomial fitting model could meet the higher precision demand in some special engineering.
Keywords/Search Tags:Large scale digital mapping, Terrestrial laser scanning technology, Curve fitting, Least squares, Batch processing, Contour
PDF Full Text Request
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