Research On The Waveform Mapping Technology And Its Application In Digital Storage Oscilloscope

With the rapid development of modern electronic information technology, moreand more computers and communications systems use high-speed serial bus to transmitdata within chip, backplane, and system equipment, and so any little clock and datajitter would have a huge impact on the whole system. This development trend presentsdata acquisition and processing system represented by digital storage oscilloscope a newdemands, and how to help users quickly find, capture and measure the signal exceptionhas become the key to the success of data acquisition system design.However, the contradiction between the high-speed data acquisition and slowdisplay greatly restricts the development and application of data acquisition system, andunder the condition of existing hardware, how to maximize waveform capture andprocessing capabilities is a major problem encountered in this research field.Under the support of National Natural Science Foundation of China (grant No.60772145and grant No.60827001), this dissertation combines the tasks of militaryelectronic equipment and civilian cooperation projects undertaken during the PhDresearch, does some research on the following aspects in depth:(1) Research on waveform mapping technology based on cache architecture. Onthe basis of the analysis of waveform mapping structure and statistical characteristics ofthe measured signal, this chapter presented a waveform3D mapping technique based onthe cache architecture, deduced theory calculation formula of waveform capture rate inthis system, established waveform mapping model based on direct mapping andassociated mapping technology. The experiments prove that the use of the technologycan multiplied waveform capture rate.(2) Research on the anomaly detection technology. From the point of view of theanomaly detection, this chapter analyzed the efficiency of the waveform mappingprocess, introduced a waveform anomaly detection technique based on the histogram ofwaveform data, also deduced theory calculation formula of waveform capture rate in thesystem. The technology greatly improves the probability of abnormal capture of thesystem. (3) Research on the3D waveform intensity adjustment and correction technique.This chapter studied the3D waveform brightness adjusting and correction technique,established the corresponding mathematical model. At last, the validity and engineeringapplication have been verified.(4)3D waveform data analysis techniques. From the analysis of the structure of the3D waveform database, the chapter proposed the waveform parameter measurementalgorithm in3D waveform database. In order to ensure reliability and precision of thealgorithm, the traditional parameter measurement method based on histogram wasimproved. At last, the validity and engineering application have been verified.(5) Model and evaluation method of waveform capture process. Firstly, this chapteranalyzed the waveform acquisition process of waveform mapping system based on theparallel structure, established the waveform capture process model, and the concept ofwaveform capture rate is classified and redefined. Secondly, this chapter proposedmeasurement methods of waveform capture rate using composite signal. The experimentsshow that this method can get more accurate and objective waveform capture rate thanthe double-pulse method.