Research Of Fault Injection Technology On Integrated Circuits By Laser

Integrated circuits used in aerospace are affected by the space radiation environment and face the risk of failure.Single event effects,that is,a single high-energy particle in space passes through sensitive node of a chip to generate ionized charges,which causes data flip,function failure,current increase and even chip destruction are the main forms of failure.Therefore,in the design process of aerospace electronic systems,the single event effects test and evaluation of chips and application circuits must be carried out on the ground,to ensure that the single event effects do not occur,or sufficient measures have been taken to deal with them.Fault injection on integrated circuits is a evaluation technology that accelerates the fault process of the chips and their circuit systems by establishing fault models to inject faults artificially.Laser fault injection is a very efficient physical fault injection method due to its high spatial and temporal resolution,convenience of energy adjustment and flexibility of use,and has received widespread attention in the field of single event effects testing.In addition,integrated circuits face the risk of man-made attacks in the field of information security.The failures caused by those active attacks are similar to single event effects,but they may damage the cryptosystem in the chip and cause the secret informations to be stolen.Laser fault injection as a general fault generation technology can play an important role in the reliability and security testing of integrated circuits.Based on the pulse laser fault injection device independently developed by National Space Science Center,CAS,this paper conducts researches on the fault types controlling and fault vulnerability mapping of laser fault injection.It summarizes the principle,fault mechanism and test method of laser fault injection on chips,achieves an accurate,universal and automated laser fault injection technology,and develops typical application cases in system evaluation of single event effects and fault attacks on cryptochip.The main researches and conclusions of this paper are as follows:1)The fault type controlling research of laser fault injection was carried out.The paper investigated the influence mechanism of laser energy,injection position and other parameters on the single-and multi-bit flip of the chip memory cell induced by laser injection,thus establishing a universal test method.For typical process integrated circuits,test data for reference of fault control are obtained.A method for verifying the effect of laser fault injection setting 0 and 1 by using power analysis is proposed.The test based on MCU is carried out,and the preliminary analysis of the effect is described.2)The research of vulnerability mapping for laser fault injection was carried out.The sub-micron-level vulnerability mapping solutions and processes are designed.The synchronous control method of laser injection,chip displacement and fault detection is proposed.Through the development of core circuit and computer software,an automatic vulnerability mapping device of laser fault injection applicable to various types of chips and all kinds of faults is explored.By mapping the weak points of SRAM memory cells under laser injection with different energy,an empirical map of laser injection setting 0/1 of 0.1?m resolution is established.3)Research is conducted on the application of laser fault injection in single event effect system evaluation.A dynamic test method is proposed and implemented,and a laser fault injection method of four-dimensional linkage in time and three-dimensional space is established.A FPGA application program is used as the research object to carry out dynamic test experiments of laser scanning injection and laser single-point injection,respectively,to obtain the dynamic response and fault distribution of the chip with laser injection time and location.The comparative study of laser and heavy ion accelerator verification tests for the typical radiation harden design of FPGA shows that laser has the advantage of controllability of fault injection rate and fault type.4)The application research of laser fault injection in the field of fault attack on cryptochips is carried out.Based on the laser dynamic test and mapping technology,the complete laser attack tests are implemented for contactless smart card and encrypted MCU.The technical process of fault attack test is summarized,which is practical and versatily.Based on the laser fault injection technology in this paper,it takes only hundreds to tens of thousands of laser pulses injection and several hours to about ten hours to recover the keys of crypto chips.