Hardware Design And New Application Of IPC-205B Type Scanning Tunneling Microscope

Scanning tunneling microscope (STM), one of the most effective and important means of testing and processing in nanometer technology, is receiving increasing popularity in application with the rising of nanometer technology. Besides the stability of the instrument itself, the quality of the re-built pictures, the simplicity of its operation, the expansion of its application sphere and the trend of becoming an industry is being more and more concerned.This dissertation is based on the foundational principles of the STM, modified-techniques related to different application and some new-typed instrument that sharing the same principles. By comparing and analyzing, this dissertation proves that there is feasibility to add new function to it. Having known about its shortages in the procedure of developing and applying, this dissertation presents the way to modify it to satisfy the need comes from new application. Some experiments were done to test the modification. More application experience is gained. This does not only expand its application sphere but also make it easy to get popularization and industrialization.This dissertation concerns the design of IPC-205B to find out the best point to add new device to it. Inserting a switch in the feed-back circuit to fit Scanning Tunneling Spectrum (STS) testing. With a function generator and a oscillograph, three specimen (Au, Si and nano-Caco3) were tested. Qualitative analysis was made about the STS obtained in the experiment. This dissertation also studied the applicability of STM as the device to detect the micro-displace of the cantilever of the Atomic Force Microscope (AFM). The cantilever is modified from a wiry one that not fit for STM as the sensor.