Research And Application Of Scanning Probe Microscopes

Atomic Force Microscope (AFM) is a new generation of Scanning Probe Microscope (SPM). It not only can be used in conductor,semiconductor,nonconductor,but also can't be limited by periodicity. It can also be used under various conditions,especially under liquid condition. This paper elaborates the concepts and principles of the AFM,introduces the systematic structure of the AFM,and studies the technology of growing the buffer layer of GaN on the SiO2 base.Photon Scanning Tunneling Microscope (PSTM) is another kind of Scanning Probe Microscope. It can measure refractive index of the sample,and proper for the application of micro-dissecting organism sample with laser. So it is very important to research the instrument "AFM/PSTM" ,which combines the advantages of both instruments.