Research On The Key Technology Of Structured Light Three-Demension Measuring System

Reverse engineering adapts numerous advanced theories and technologies in the fields of computer vision, computer measurement, control theory, digital image process and sensors. Its rapid development and its perfect combination with advanced manufacture technology, such as Rapid Prototyping, have presented an unprecedented manufacture mode in the world. 3D measurement device, as the basement of reverse engineering, is taking an increasingly important role in advanced manufacture for its widely used in the whole manufacture process of products, such as design, manufacture, measurement of the product and real-time check during the manufacture stage. So, it is the key point of responding advanced and rapid manufacture to develop 3D measurement device. Based on the systematic study on the development of reverse engineering measurement device, this paper provides the research and development of structured light 3D measuring system. In this paper, a 3D object measurement system based on binocular grating structured light measurement techniques is presented. Because it is an area-scanning mode, so this method can realize quicker and higher accuracy 3D measurement. In the paper, main contents are followed: The actuality and developing direction of reverse engineering measurement equipments are introduced. The advantages and disadvantages of variable measurement techniques are discussed. And, research direction of the paper is put forwarded to. Basic knowledge of machine vision is discussed. Through the academic analysis and actual experiment, a 3D structured light measurement system is determined, including hardware configuration and design. At last, a pattern machine is developed. Image acquisition and motion control systems are keys to a measurement system, affecting the accuracy of a stereo matching. After analyzing the principles of the measurement system, a feasible plan about image acquisition and motion control system according to requirement are provided. At the same time, hardware configuration and software design are presented. The measurement of range information about an object is an important step in non-contact measurement method. The key of structured light measurement is to determine the match relationship between the left image plan and right image plan. After discussing the variable encoding technologies, the paper presents a grate encoding method to solve the encoding problem. And, a grate matching algorithm based on bi-epipolar geometry constrain is provided to solve the problem of range information of a object based on structured light in machine vision field.