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Study And Application On Concurrent Design Method For Statistical Tolerance & CUSUM Control Chart

Posted on:2007-05-26Degree:MasterType:Thesis
Country:ChinaCandidate:Q H WangFull Text:PDF
GTID:2132360185450344Subject:Mechanical and electrical engineering
Abstract/Summary:PDF Full Text Request
The application of the current Shewhart control chart is to monitor the process stability, but it cannot assure the expected quality target. With the high quality requirements to modern manufacturing enterprises, this traditional control chart technology can no longer meet the need of the modem manufacturing corporations. To monitor a process to be in the stable state as well as assuring quality target, statistical tolerancing combined with the SPC technology is required. The research is developed for meeting this requirement that Quality-oriented statistical tolerance and CUSUM control chart to be concurrently designed.Four main points of this paper are as follows:1. The method of optimizing the parameters of CUSUM control chart, monitoring the process variance, and combination of the CUSUM chart with other tradition control charts to monitor process mean.2. The study on concurrent design method for quality-oriented statistical tolerancing and CUSUM control chart;To guide the parameter design of CUSUM control chart, the dynamic statistical tolerance zone chart is introduced based on quality-oriented statistical tolerancing. Thus, concurrent design for quality-oriented ST& CUSUM control chart can be done.3. The application and case study on concurrent design method for quality-oriented ST& CUSUM control chart;Application of this CE method for assuring the matchable degree of selective assembly.4. The development of the application software system on concurrent design method for quality-oriented ST& CUSUM control chart.
Keywords/Search Tags:statistical tolerance technology, quality target, cumulative sum control chart, concurrent design
PDF Full Text Request
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