The Test System Of Resistity Of The Semi-conductive Shield Of The Power Cable Based On The Virtual Instrument

The high voltage power cable is a basic equipment in the electricity transmitting. As the wide application of the XLPE Power Cable and ultra high voltage, people give more and more attention to the cables' security and reliability. The semi-conductive shield is an important ingredient of the power cables which directly affect the runtime and reliability.The measurement of resistivity of the semi-conductive shield is a preventive test which is judging the cable whether is qualified or not. But in the practical tests, there are many limitations such as deficient data, false record, got-up disposal. Meanwhile, because of the factitious factor, the veracity and reliability of the records are not given satisfying assurance. Based on such reasons, this paper designs a test system used to effectively measure the resistivity of the semi-conductive shield in electric type approval test, which is based on Virtual instrument (for short VI) about the resistivity of the semi-conductive shield.In the first part, the article introduces the recent tests about the resistivity of the semi-conductive shield, and then it proposes this research's significance and contents.In the second part, it discusses the limitations of the conventional test apparatus and the future of the test system. It figures out that the VI technology will be the significant direction of the automation test system and electronic measure instrument in the future. And the VI technology is introduced to this study. Then the article introduces the recent work, some basic concepts, characteristic, the structure of system's software and hardware of the Virtual instrument, it compares to the advantages and limitations of the hardware system. At last this chapter introduces the LabVIEW platform using the graphical programming language.In the third chapter, it expatiates on the measure principium about electric parameters of this test system, and the essential structure of Data acquisition system based on computer. Based on the above mentioned, according to the performance and demands of the test system, the design scheme of main functional modules in DAQ are given, the software structure which is the design scheme of Vis' software system structure are given too. After comparing with frameworks of modern test system, PC-DAQ virtual instrument design mode was adopted to design the resistivity of the semi-conductive shield test system.The fourth chapter introduces the design of the hardware about the test system. After...