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Research On The Non-contact Measurement Method Of The Precision Of The Planar Double-enveloping Annular Worm Based On CCD

Posted on:2009-11-06Degree:MasterType:Thesis
Country:ChinaCandidate:J M ZhangFull Text:PDF
GTID:2132360242987749Subject:Mechanical and electrical engineering
Abstract/Summary:PDF Full Text Request
The planar double-enveloping annular worm is developed independently by our country. Since it has the advantages of double-line contact and larger composite cure radius, compared with the normal worm, it has increasingly extensive application in industry, and it becomes more important to rapid detection and high precision of the manufacture error.The surface of the planar enveloping worm gearing is complicated, so it is more difficult to measure the surface precision. Now many factories mainly depend on experience to check or contact method to measure, which has a lot of shortcomings, therefore the problem hasn't been solved virtually.Through the research on the development and actuality of the non-contact measure technology in the domestic and international, the paper puts forward a new kind of measurement method, which is non-contact with area CCD to take the images of the worm. Based on briefly analyzing the generating principle of the worm, the mathematics model of the worm gear surface is founded, and then the equation of the theoretical contacting line of the worm is given. By studying the measurement principle of the worm precision and the machining principle of the worm, the total project of the measurement system and the total mechanical structure are designed, the work principle of the system is elaborated, and then the worm image sampling system is introduced, the control circuit of CCD is also studied. Using the computer software, this paper introduces the methods of image processing for the worm contacting line. With certain mathematics method, the 2-D contacting line processed has been reconstructed in 3-D worm surface, and comparing the measured worm gear surface with the theoretical surface, the worm precision can be annlyzed. It is an attemptent for the non-contact method with CCD to measure the precision of the planar double-enveloping annular worm, which will expand the application fields of non-contact measurement method and take on important theoretical and practical meaning.
Keywords/Search Tags:planar double-enveloping annular worm, worm precision, non-contact measurement, CCD, image processing
PDF Full Text Request
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