| Although the demand to reliability of e-products gets higher and higher, enterprises cannot ignore cost only for the pursuit of high reliability. To practice reliability experiments needs amout of human and material resources and a lot of money. While full factorial designs could be finished perfectly, we may not only waste more funds, but also have no enough time. Many factors that influence the reliability of connector exist. Due to the demand of limited time and funds, we can not perform all the experiments. It is highly important to design a suitable way to test and perform reliability.The thesis begins with the reliability problem arised by the key product DOUBLE DATA RAM(DDR) of our compay in the A client company, and deeply analyses in many ways. It anlyses several main failure models and setting up the Fish-Bone Figure and Fault Tree Analysis; ensure the contact failure be the main failure model, discuss the contact failure theory under three stress and build a reliability model. It also research on the model of advanced design of electrical connector under the temperature-humidity enviroment and the vibration stress effect. It concludes a series of better methods to accelarate life tests. Apply to the methods, we can design a testing way quickly and improve the reliabilty obviously through a series of experiments and targeted improvements. |