Study On Contact Reliability Of Electrical Connector With Comprehensive Stress

Electric connectors used for electrical connection and signal transmission are widely used in aerospace and weapon equipment as electronic components that most prone to failure resulting system not working properly.The reliability and safety of electronic system depend on electrical connectors with worst reliability,which mattered most to the electronic system.In this paper,reliability and failure mechanism of electrical connectors are analyzed and studied respectively,and the parametric model is constructed to conduct simulation test analysis to study the effect of temperature and vibration stress on the reliability of electrical connectors.The main works in this paper are shown as follows:(1)Reliability of electrical connector is studied bases on analyzing the domestic and abroad status of reliability development.Research status and existing problems of electrical connector reliability is studied by the combination of finite element analysis method,simulation analysis method and reliability analysis of electrical connector.(2)From the point of view of electrical conduction,the failure mechanism and the main failure modes are analyzed.Temperature and vibration stress are the main causes lead to failure modes is found.(3)Finite element analysis including influence of structure parameters of contact body on reliability of electrical connectors is conducted by ANSYS.Process for conducting contact body analysis of electrical connectors includes the steps of:(a)reliability analysis on contact part with same contact height in different contact length;(b)reliability analysis on contact body with same contact length in different contact height;(c)reliability analysis on contact body with same contact area in different contact dimension;(d)reliability analysis on contact body with same contact dimension but different number of contact cores.(4)According to the failure mechanism of electric connector,the failure physics equation and life distribution function are derived under the comprehensive stress.The life of electrical connectors follows the two parameter Weibull distribution by statistically analyzing the electrical connector reliability test data.(5)Reliability growth plan of electrical connector acted on temperature vibration stress is put forward according to the results of previous chapters.The improving reliability method is obtained at last based on combining failure mechanism with the previous ANSYS analysis results.