Research Of Testing FPGA

Field Programmable Gate Array (FPGA) allows programming of the device, which are suitable for design and low-volume production of ASICs. Recently FPGAs apply in larger fields and are rapidly growing in importance. With the popular applition of the FPGA, the requirement of veracity and reliabity are very important for FPGAs. Following, it is essential for FPGAs to research the fault diction, fault diagnosis and testing technology.The paper introduced the configurations and characteristics of XC4000 series which are the typical SRAM-based FPGAs, the configuration modes and orders of XC4000 series device also mentioned. As for the module function and characteristic of XC4000 products, it can be devided to five parts, configurable logic block (CLB), input/ouput block(IOB), interconnect reaource(IR), configurable interconnection block(CIB) and carry logic module(CLM).To test those five function-modules, separately manage method is used. The paper discussed the test details of those five function-module one by one. Because of the best specialties of RAM, the signals generation mode of RAM was discussed separately. We used the "one dimensional arrays" method to test the function-modules. The same function modules was connected, and the test vectors was applied at common input and initial input, then the result would be output following with one dimension array. Considered of the limitation of FPGAs I/O port amount, the controllability and observability. We used this method and well solved the test of function modules and found high fault coverage.