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Development Of A Measurement System For Electrical Performance Parameters Of Materials Based On LabVIEW

Posted on:2015-04-27Degree:MasterType:Thesis
Country:ChinaCandidate:H ChengFull Text:PDF
GTID:2181330422990251Subject:Metallurgical engineering
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Measurement control technique has been widely used in modern science, industrial production, national defense and other areas. Networked based measurement control technique and the relevant testing system based on computer and network technologies are getting more and more applications in many fields. LabVIEW is a software development tool based on graphic programming, due to which the efficiency of development is increased and the request of development engineer is degraded. A variety of functions involved in LabVIEW makes it an ideal tool for test development, measurement, automation and control in different applications.Agilent4294A precision impedance analyzer could measures a variety of electronic devices and materials. It is a powerful tool for circuit design and development as well as the material research and development. Keithley2400digital source-meter is consist of Voltage source and current source, voltmeter and ammeter. It is especially suitable for the need of precision voltage source and current source drive and for application of current and voltage measurementWith the fast development of digitized instruments, the accuracy request of instruments get higher, the functions get richer, and the performance gets better. But in the cases with more complicated situations and more testing parameters, there instruments still subject to some problems such as inconvenient use, low accuracy of test data, and so on.In order to perform more convenient test and acquire more accuracy test data, in the article, we developed a system for electrical performance parameter measurement of materials. This system consists of host computer, slave computer temperature acquisition hardware, and measure instruments of electrical performance parameter: Agilent4294A precision impedance analyzer, Keithley2400digital source-meter, and a LabVIEW based controlling software. Host computer is the core of the whole system. It is used to realize the test in the process of inspection, supervision and control functions. Taking advantage of computer hardware and software, both the function of measurement increase, and improve the technical performance. Temperature acquisition hardware could be in the simple interconnection with the local computer or other instrument equipment.PT100is employd as temperature sensor in slave computer in which STC15F2K60S2is used as a main control chip for temperature measurement. The host computer consists of temperature acquisition section, measure instruments. A reliable communication has been built between the host computer and the slave computer to get the parameters of compounded samples at different temperatures.Test result show that the slave computer acquires temperature data and sends it to the host computer successfully, the whole system satisfies the test demands.
Keywords/Search Tags:Virtual Instruments, Data Acquisition, LabVIEW, Agilent4395A, Keithley2400
PDF Full Text Request
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