Several Of The Atomic Force Microscope (afm) Imaging Modes

A general trend to Scanning Probe Microscope (SPM) is multiple functionalities. According to the principle of AFM, microscopes that are applicable for various domains can be developed, namely the extending of different scanning mode of AFM.Several elementary imaging modes of AFM are first introduced. Phase imaging in Tapping Mode AFM using dynamics theory, energy dissipation theory in tip-sample interaction and the principle of A-P-Z curve have been analyzed. How to set the scanning amplitude parameters by A-P-Z curve is discussed. Stand or fall of phase images is determined by the choosing of scanning amplitude parameters. False parameters may lead to false reports of experiment results in phase image and consequently the images are unauthentic. Choosing a good scanning amplitude parameter is very important in phase imaging. A new type multiple microscope AF/PSTM (Atomic Force/Photon Scanning Tunnel combined Microscope) is introduced and some experimental results are given. At last, Pulsed Force Mode in AFM is introduced in detail.