Automatic Diagnosis Based On The Radar Of The Boundary Scan Circuit Board Failure

With the development of electronic technology, our radar system has been continuously developed and are now on the modern way to electronization and informationization. But with the expansion of the radar function and automation level, there are a lot of disadvtange in test and repair of radar equipment, such as lack of test equipment, low-levels automation and long-cycle repair, all these severely constrained and influenced the army's combat capabilities. Therefore, ATS is now playing an important role to improve the combat effectiveness of weapons and equipment support capabilities in the military field, so many countries focus on it. ATS architecture and intelligent fault diagnosis method also have became a leading technology in this field.In this article,author make the radar circuit's test method and application in a radar ATS as our primary reserch target, mainly put the method of fault tree and modular to analyze principles of circuit and locate fault. To those electronic circuit which include complex chip such as FPGA,CPLD,CPU or mixed-circuit board, author introduce some test method in this ATS platform and put forward some feasible fault test plan.In those different types of circuit fault diagnosis scheme,we mainly study a boundary-scan methods for digital circuit fault diagnosis. Then combined with ATE resources to make use of high-speed digital IO to simulate TAP controller to test UUT, introduce the design idea and carry out the actual verification to prove this method could not only increase fault coverage but also save the cost of ATS.Then we take the Data Switch circuit as an example, describe how to develop TPS under ATS, it include principles analysis, interface adapter design and diagnostic process development and using boundary-scan controller simulation method to test and locate diagnostic on the board. The result prove that the simulation method could effectively applied to the ATS platform to deal with the problem of circuit auto test with FPGA or CPLD, it also improve the diagnostic efficiency and automation level.At last, Author summarize the test methods and processes, raised some problems and advise for future work.