Development And Application Of The Test System For HVIGBT Characterization

1GBT is widely employed in the middle and high power converters, and the dynamic characteristics are the main factors affecting its SOA. The electrical stresses and switching losses of IGBTs are directly influenced by the driving conditions, operating voltage, operating current, junction temperature and transition loop inductance. In this paper, a universal off-line test system dedicated to the dynamic characterization of full range IGBTs is developed. Test conditions are auto-adjusted by the PC & DSP control unit and test results are conveniently recorded.Since the high voltage and high current test system is monopolized by the power semiconductor manufacturer, thorough research in the area of high power converters reaches its bottleneck. The purpose of this thesis is to advace the work in this area by building up a high power test-bench with high accuracy and bringing up the relative analytical methods.Firstly, the implementation of universality and high accuracy for the test system is analyzed, mainly concerning the circuit volume, the parasitic parameters, the test equipment and the module packages. Besides, the detailed design methods for each part of the test system are given.Secondly, the dynamic characteristic test experiments for Infineon 1700V/800A module FF800R17KE3, Fuji Electric 3300V/800A module 1MBI800UG-330 and Mitsubishi 4500V/900A module CM900HB-90H are accomplished respectively, from which the switching characteristic analysis under different test conditions and the dynamic failure caused by the diode reverse recovery for high voltage and high current situations are discussed. At last, the quasi-online analysis for switching losses calculation of high power inverters such as the NPC three-level topology is developed based on the proposed off-line test system.