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The Distributed Acquisition Circuit Design For Transient Signals

Posted on:2014-02-23Degree:MasterType:Thesis
Country:ChinaCandidate:Y LiuFull Text:PDF
GTID:2232330395492010Subject:Measurement technology and equipment
Abstract/Summary:PDF Full Text Request
Explosive blast performances an important parameter in the evaluation of weapons. Incurrent, storage test equipment can commonly used only a single test, failing to meet the rapidreproducible test requirements. In this paper, the transient parameter signals distributed testingas the background, designed a set of high-speed signal collecting, saving and transferringfunction as one of the nodes circuit of the distributed test system, which can be used inwater-base, land-based explosion test, etc.Firstly, the paper studied the basic theory of distributed test system, and made a necessary discussion on five aspects of distributed test system, including time synchronization, node positioning method, data acquisition, the characteristic of storage and trigger control.Based on this, paper advanced a kind of design thinking of node transient signal acquisition storage. In storage design, the use of1MB capacity of high-speed nonvolatile memory as data buffer is used to realize the transient signal acquisition. Thecircuit adopted quantitative data signal as a trigger signal. And negative delay triggercontrol mode is designed. The trigger threshold adaptive technology can ensure the stability of trigger system. The time synchronization information is added in the designof the coding circuit. It can be used in the subsequent data processing and reconstruction. In data transmission, data transmission interface is designed to be based on SPIbus. Related operations can be performed by decoding the orders of the master station,also can finish fast data transmission, so as to realize repeated trials.Using the FPGA design, the circuit can achieve at highest4Msps in dual channelsignal acquisition, and the memory can save the data at a speed of about15MB/S.Experiments confirmed that the system can through the high-speed data acquisition andcontrol of data correctly feed-back.
Keywords/Search Tags:Distributed test systems, Negative delay, FPGA, FRAM
PDF Full Text Request
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