The Design Of Universal Distribute Test Node Based On UDP/IP Protocol

In some special parameters of test and measurement applications,such as explosionshock in weapon wave testing system, meteorological data and humidity test under the badenvironment,tradition single point test methods had been unanle to meet the testrequirement.Meanwhile distributed test system,which is based on networked test andmulti-node, has become the most popular developting direction of modern test andmeasurement task. In order to be suitable for multitashing distributed testing as thebackground, a design of mutli-channel,general-purpose,high-speed data acquisition,storageand transmition distributed test node is presented.The essay makes a lot of research on the working principle of distributed test system,alsomakes a lot of research on networking mode,high speed data transmitting and large capacitydata-storage.On the basis of the theory research,the paper offers a kind of Generalperposes,High-speed data acquisition and storage,High-speed transmitting distribute testnode.In the design of General perposes,design can achieve a certain range of voltage signaland current signal acquisition.In the design of Data-storge, design adopts the idea of storgearray based on NAND FLASH. In the design of High-speed data-transmitting, design adoptsthe idea of high-speed transmitting based on UDP/IP protocol and RJ45.In addition,test nodesalso design adaptive negative delay trigger in allusion to the need of test. It will be completedthe adaptive,self-trigger in the test of environment parameter.The design uses FPGA as the hardware exploring platform.It can achieve highest1Mspsper channel;15MB/S storage speed;41Mb/S transmiting speed.According to testconfirming,test-node can achieve high-speed signal acquisition and high-speed datatransmiting.