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Measurement Of The Modularity Of Knowledge Network And Its Effects On Utility Of The Invention In Semiconductor Industry

Posted on:2014-02-04Degree:MasterType:Thesis
Country:ChinaCandidate:J J XiaoFull Text:PDF
GTID:2249330395499669Subject:Regional Economics
Abstract/Summary:PDF Full Text Request
Enterprises pay more and more attention to the core technology research for the reason that the impact of technology is increasing fierce in competition between enterprises. Modularity is a better way to deal with complexity, it can divide complexity technological innovation to general module, and enterprises don’t need to waste time and energy on it. So modularity can increase the efficiency of the technological innovation. However, there has been little attention paid to the impact that the knowledge network modularity brought to the utility of innovation. So the measurement of the modularity of knowledge network in semiconductor industry and the Impaction of utility of the invention is researched deeply.Based on the time-series patent data of1976-2000years, co-integration test, error correction model and granger causality test are used to analyze the impact of modularity upon the utility of innovation in the semiconductor industry. A long-term and equilibrium relationship between knowledge network modularity and the utility of innovation in the semiconductor industry is found. Short-term fluctuations deviate from equilibrium state would be amended by ECM. At the same time, knowledge network modularity has a positive correlation between the utility of invention, and in the lag period for5years, the result passes the test of significance of1%, it proves that knowledge network modularity is the granger reason of the utility of invention.Therefore, semiconductor industry in China should adopt a modular development strategy and establish strategic relationship of strong-strong cooperation, so as to promote the technology level of semiconductor industry and its market position.
Keywords/Search Tags:Knowledge Network, Modularity, Utility of the Invention, QuantitativeMeasure
PDF Full Text Request
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