Application Of Embedded Point Switch Detection System Based On Machine Vision

As the electric traction equipment for railway turnouts, the reliability of switch machines is strictly related to the railway security. However, with continuous railway speed acceleration, switch machines have to withstand increasing speed and load impact, which renders real-time online monitoring of switch machines more and more important. Therefore, the present thesis realizes machine-vision-based embedded turnout gap monitoring system integrating a variety of equipment and technologies including embedded equipment, image capture and compression technology, h.264encoding technology, digital image processing technology and CAN field bus technology.The present thesis elaborates on the working principles and basic functions of machine-vision-based embedded turnout gap monitoring system, regarding its overall design scheme and design scheme of each module, including hardware principles, image acquisition principles, MFC-based h.264hard code and CAN bus communication protocol.It identifies ARM-Linux application programs, expatiates the overall process:the images are firstly captured by V4L2-based image acquisition technology, which are coded through high-speed and stable s5pv210MFC chips; then the video data is sent to the bus through MCP2510CAN controller. The present research also designs reliable application layer protocols for high-speed efficient transmission.The main functions of the overall system mainly comprises periodic testing of turnout switch machines, sending the test data like image files and video files via the CAN bus to CAN/Ethernet gateway, and finally forwarding the data to principal computer through the gateway; at the same time, gap nodes can respond to railroad switch machine action and principal computer command to collect data, pictures and videos. In the end, the present research carries out functional test and EMC test on the embedded turnout gap monitoring system, using hardware and software tools to solve problems arising in the test, thus paving way for future productization of the equipment.