Research On The Hardware-in-the-loop Test Platform For Onboard ATP Equipment Of Train Control System

Train control system is an important part to ensure the safe operation of trains, and the onboard ATP subsystem is one of the core equipment. Therefore, complete test of the onboard ATP subsystem is necessary considering the functionality of the system. However, the complex structure and the tight operating rhythm increases the difficulty of the test. The traditional test methods include computer simulation and field test, which have lots of limitations due to the inherent form of the tests.In this thesis hardware-in-the-loop (HIL) method is used to test the ATP subsystem which construct a test platform combined the ATP subsystem with the peripheral interface circuits. In this way, we can improve the completeness of testing without affecting the efficiency of the operation. The main function of onboard ATP subsystem will be tested and analyzed based on the test platform for onboard ATP subsystem. The main work are as follows:(1)The test requirements of onboard ATP subsystem are analyzed according to the CTCS-3 train control onboard equipment specifications, which means that the main function test and state transition test are required. The overall structure of the HIL test platform is designed to meet the requirements which is composed of the NI simulation system and a train interface circuit.(2)A test scheme is designed to aim at the speed measurement and the speed supervision functions of onboard ATP subsystem. The datas that ATP subsystem requires,such as AB square wave,MA,etc,are produced and sent by simulation equipment and we judge whether ATP subsystem operation is normal based on the braking signal generated by ATP subsystem.(3)The interface circuits are developed based on the STM32, which can provide input, capture output information of the ATP subsystem and communicate with ATP subsystem with CAN bus.(4)The onboard ATP subsystem is tested and analyzed based on the Contract Checking method. Test sequences can be generated automatically referring to the FE algorithm for the Chinese Postman Problem and then complete the test work of the node through the pre-conditions and post-conditions.The results demonstrate that the HIL test platform for onboard ATP subsystem meet the test requirements. The results also show the methods we proposed can be applied to the test of ATP subsystem benefiting from the flexibility and convenience.The scope of the HIL test platform can be extended by means of the flexibility of the simulation computers and the interface circuits, which make it possible to test the other equipment of train control system by increasing several interface circuits.