Anti Radiation Prototype Design Of The Visible Light Image Acquisitionsystem On Satellite

The energetic particles in the universe space are the important factors that threaten the normal working state of the spacecraft, in recent years, human beings have increased the intensity of the development and utilization of space resources, more and more complex spacecraft into space. The complexity of spacecraft mission and function put forward higher requirements to the space electronic system, large scale integrated circuits, such as FPGA and DSP, have been widely used in the space environment. However, with the increase of the scale of the integrated circuit and the improvement of the process and working frequency, the effect of space radiation effect on the reliability of the device is more and more significant. in particular, the single event effect(SEE) caused by space radiation has become the most important factor affecting the reliability of space electronic system. It is of great practical significance to study the anti-SEE of the electronic system for the space exploration.First of all, in this paper we introduce the overall structure and working process of the visible light image acquisition system, a brief description of the composition of each function module is made, the internal logic design of FPGA interface circuit and the working flow of DSP are introduced in detail.Secondly, in order to improve the reliability of the system, the method to solve the SEE of the system are considered, the SEE sensitive unit of CMOS image sensor, FPGA and DSP are analyzed, the possible effect of SEE on the device is discussed. According to whether the user can access the sensitive unit or not, the logic hardened objects are selected. Different hardened methods are adopted for the characteristics of the object itself.Finally, the test environment of the system normal work performance is introduced, and the hardened effect of the system is analyzed. According to the cross section curve of the device and the target orbit radiation environment, combined with the fault injection results, the function failure and data error probability of the system before being hardened is calculated according to the Poisson distribution. The reliability of FPGA and DSP is analyzed, and the error probability of the system is calculated according to the analysis results. The calculated results show that the function failure and data error probability of hardened system is lower than original system, it is proved that the hardened measures taken in this paper can effectively improve the reliability of the system.