Design Of Intergrated Circuits Automatic Test System Based On LabVIEW

Scientific advances over time in the never-ending innovation of science and technology, in the electronics sector after a long period of development, all kinds of electronics products grew, relative to the heart of the electronics for integrated circuits, and their use has become an increasingly widespread, both the appliance and the military radar, are inseparable from the integrated chip control. Continues to meet the needs of the development of various types of electronic products, integrated circuits have been innovative, integrated more and more, this growing challenge for IC manufacturers. Integrated circuit manufacturers in order to improve the capacity and performance of integrated circuits to achieve the objective of improving competitiveness. Integrated circuit test could save production costs while increasing production efficiencies in the production process, so as to achieve the aim to improve the competitiveness of the company. In integrated circuit production process, tested qualified after the following can only be put on market, for integrated circuit manufacturers bring in revenue.Integrated circuit testing of integrated circuits are needed for multi parameter test and a variety of functions. So when it comes to large-scale data collection and processing, which requires testing system for high-precision data acquisition and data analysis, handling capability in the late has a lot of requirements. Now test area has been moving in the direction of automation and accuracy of automated testing equipment data collection and analytical capability becomes a bottleneck. The main purpose of this paper is to address this issue presents a design and implementation of automatic IC test system based on Lab VIEW. This article mainly uses method is a virtual instrument technology to replace traditional instrument measurements.main technological innovation is combining technology of virtual instruments and hardware acquisition. Bridge testing system for data acquisition and data analysis in the past, lack of operational capability.Test design test system based on the memory chip, the design of the test system algorithm for FPGA test modules using the Verilog HDL language, analysis of control interface using LabVIEW graphical programming to design and write the control interface program. Take advantage of virtual instrument technology in combination with FPGA algorithms to improve the automation of test systems. This success is a combination of virtual instruments and hardware acquisition system design of automatic test system. Virtual instrument and LabVIEW has tremendous flexibility and scalability. Test system on your computer, just a small part of the program can be adapted to most IC testing. Brings great convenience to the design of the testing system.