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Design Of Test System Of Low-level Image Processing SoC

Posted on:2017-04-09Degree:MasterType:Thesis
Country:ChinaCandidate:W WangFull Text:PDF
GTID:2348330503972432Subject:Control Engineering
Abstract/Summary:PDF Full Text Request
In order to test the practical operation effect of the SoC after it has been taped out, there is much necessity to undertake board-level test. The SoC to be tested is an integrated circuit chip which is designed by our laboratory, and its functions include the control of the infrared detector, the acquisition of infrared images, the preprocessing of the image and the extraction of the object, the control of the liquid crystal device, and so on, and it is named Infrared image information So C V1.0.In this thesis, aiming at the function setup of this SoC, the realizing scheme of the test system is proposed, and it accomplishs the designing and debugging of the test system, and the testing of the functions of the SoC. The hardware structure mainly consists of the design of the power supply system, the converting of the analog video signals of the infrared detector, the generation of the rectangular wave driving signals of the liquid crystal device, and so on. In the design of the analog signals converting circuits, the adopted circuit structure can effectively suppress the common-mode noise and accurately extract the interested information. During the design of the rectangular wave driving signals, two ideas are compared through theory analysis and simulation, and the better one has been chosen in the end. In the internal logic circuit of the FPGA,the SOPC(including Nios II CPU) system is created, and the I2 C interface is constructed to control the ditital potentionmeter, thus realizing the automatic adjustment of the liquid device driving rectangle wave signals. According to the image processing functions of the Infrared image information SoC V1.0, through the combination using of dial switch, the control of the interface of FPGA, and the data processing of the PC, the testing of every module of the data path of SoC is achieved.Eventually, the debugging and testing results indicate that: this test system can undertake the test of all the ports of this SoC; it can realize the circular processing and VGA display of 109 frames of images whose resolution is 640×480, and the frame frequency of the VGA display is 60Hz; it can output the Liquid device driving signals whose relative error is less than 5%. Through the test of the So C using this test system, it concludes that all the tested seven modules of the data paths of the So C function correctly, and the So C can work stably under the clock frequency of 80 MHz. All the testing results indicate that this test system achieves the predetermined funtion.
Keywords/Search Tags:function verification, SoC(System on Chip), Infrared image processing, Differential Analog to Digital Converter, Adjustable amplitude
PDF Full Text Request
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