The Design Of Integrated Test System For A Spaceborne Anti-Radiation Chip Of A CMOS Multi-Function Controller

In order to evaluate the electrical specification,temperature sensing,channel consistency temperature compensation and single event tolerance of spaceborne phased-array T/R modules,an integrated test system based on PXI bus is designed and developed.By using this test system,the evaluation of a self-developed CMOS integrated multi-function controller,which is embedded in a spaceborne X-band T/R module,is performed in this paper.By using high-speed digital I/O technology,the test speed of the present test system for electrical characteristics is improved.The ability of automatic temperature test with high-precision enables the accurate perfor-mance assessment of both temperature sensing and temperature-compensation.In ad-dition the system integrates single event effects test function,and with the ability of automatic data processing,the test system can realize the comparison between the measured electrical properties and the design specifications,the error analyzation be-tween test data and calibration temperature and the variation estimation before and after single event effects.Finally,electrical specification,temperature sensing,tem-perature compensation and single event tolerance of the chip are tested and analyzed.The results show that the chip performs properly and the test system has the advan-tages of simple operation,well portability,high speed of testing and high precision.