Development of the EBSD Intensity Response for Quantitative Strain Analyses of Materials

Electron BackScattered Diffraction (EBSO) systems can be considered as a tool providing three kinds of responses: EBSD patterns (EBSPs) themselves, an indexing response (orientation data), and an intensity response (also called Band Contrast "BC", Image Quality "IQ", or Pattern Quality "PQ or P"). This work focused on the characterization and development of the intensity response.;This project constitutes an exploratory study on the development of the intensity response for quantitative strain analyses of materials. A new modelling and statistical approach is presented and assessed for transforming the raw (current) intensity response (values and grey-tones of intensity images) of commercial EBSD systems into an accurate and reproducible parameter allowing objective visualization and measurements of strain.;For now, the intensity response cannot be used for quantitative microstructural analyses, including strain analyses of materials. Indeed, this response is affected by several material and experimental conditions. Moreover, properties of the intensity response (strain sensitivity, reproducibility, exact relation with EBSP quality or diffraction band intensities) are not well-known and understood.