Alternative thin-film buffer layer materials for lithium-ion conductors in highly reducing environments

This work mainly focuses on the characterization of thin films of Lithium Lanthanum Zirconate (Li7La3Zr2O12). Li7La3Zr2O12 is one of the promising solid electrolyte for solid state batteries because of its high conductivity and stability with Li metal anode. Pulsed laser deposition (PLD) technique was used to deposit thin films of Li7La3Zr2O 12 on silicon (111) and silicon nitride substrates. Detailed structural and electrical characterizations were performed. The samples deposited at low temperatures (300 °C) had amorphous structures and produced n-type silicon substrate XRD patterns. Post annealing of the deposited films improved the crystalline structure and the XRD patterns. Images from Scanning Electron Microscope revealed cracks on the surface of the Li7La3Zr 2O12 deposited samples, which was considered as the reason for low conductivity. Copper contacts were laid on the sample to measure the DC conductivity which was 6.09 x 10-8 S/cm. Conductivity at different temperatures was tested to calculate the activation energy which was 0.57eV.