Advances and applications in scanning probe microscopy

This thesis describes the design and construction of various types of Atomic Force (AFM) and Scanning Tunneling Microscopes (STM). AFM work included the design of an AFM for attractive mode imaging and also an AFM based on a laser diode. All AFM designs were based on an optical beam bounce detection technique. STM instrumentation work largely involved the development of a Scanning Tunneling Microscope for instructional purposes.;The AFM was introduced as a tool to probe particle to surface adhesion. A technique for mapping out surface adhesion properties is described. Results on the dependence of adhesion to surface topography and material composition are presented and analyzed. Additionally, the study included the electrical component of particle to surface adhesion. Experimental technique and results are presented.;Work was initiated on a new AFM cantilever to reduce the interaction force between the probe tip and surface. The design involved integrating a tunneling detection system into the cantilever itself. Preliminary results showed promising images.