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Preparation And Photoelectrical Properties Study Of Ga2O3:Sn Thin Films

Posted on:2022-02-11Degree:MasterType:Thesis
Country:ChinaCandidate:F X MengFull Text:PDF
GTID:2481306572453424Subject:Materials Science and Engineering
Abstract/Summary:PDF Full Text Request
Wide-gap semiconductors have broad and important prospects in solar-blind ultraviolet detection.Therefore,in recent years,the third-generation semiconductors represented by Ga2O3:Sn have become a hot topic of research and discussion.Among them,Ga2O3:Sn film has good chemical stability and photoelectricity.Excellent performance,is one of the ideal materials for the preparation of a new generation of deep ultraviolet detectors.The magnetron sputtering method has low cost,wide application,low working temperature,and is suitable for large-scale application in industrial production.Therefore,this thesis uses RF magnetron sputtering to realize Ga2O3:Sn films and solar-blind ultraviolet detectors on sapphire substrates and silicon substrates,and studies their photoelectric detection performance:(1)The Ga2O3:Sn film is prepared on a sapphire substrate,and the in-situ annealing temperature is not enough to crystallize Ga2O3:Sn.Increasing the annealing temperature will widen the optical band gap of the film.However,an excessively high annealing temperature will affect the optoelectronic properties of the device.When the oxygen content in the sputtering atmosphere is too low,the doping ratio of Sn will be increased,reducing the optical band gap of the film and also reducing the crystal quality;The preparation of Ga2O3:Sn films under low pressure conditions will regulate the band gap,but also damage the crystal quality;In the intermediate pressure region,the crystal quality is better and the crystal grain size is uniform.(2)Prepare Ga2O3:Sn film on silicon substrate and grow low-oxygen buffer layer to obtain higher quality crystals;Too high sputtering power will increase the surface roughness of the film and deteriorate the degree of crystallinity;The growth of Ga2O3:Sn film on the substrate is similar.The doping ratio of Sn can be adjusted by changing the oxygen-argon ratio;increasing the annealing temperature will gradually increase the grain size of the Ga2O3:Sn film,but high annealing temperature will damage the film compactness.(3)For Ga2O3:Sn devices on a silicon substrate,doping with Sn can improve the sensitivity of the device,but it will also prolong the relaxation time of carriers;The device has a very high temperature at low annealing temperatures.The responsivity and external quantum efficiency can reach 3.467 A/W,1694%,but increasing the annealing temperature can speed up the carrier recombination speed.For the Ga2O3:Sn device on the sapphire substrate,the dark current of the sample is one to three orders of magnitude lower than that of the Si substrate.This is because the polycrystalline film grown on the sapphire has good crystal quality and fewer oxygen vacancies.
Keywords/Search Tags:Ga2O3:Sn thin films, Radio frequency magnetron sputtering, MSM photoelectric photodetector
PDF Full Text Request
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