Software Design Of AFM System And Research On Image Correction

Atomic Force Microscope(AFM)is a kind of high-precision experimental instrument with sub-nano resolution accuracy and strong adaptability to environment under atomic and molecular scale characterization,which can carry out nondestructive testing and scanning imaging on scanned samples.At present,AFM has greatly promoted the development of many scientific research fields such as materials,electronics,physics,biology and so on due to its advantages of ultra-high resolution accuracy and so on.In this subject,as that basic of the hardware system of the lower computer,develop the matching software system of the upper computer AFM human-computer interaction.It can realize data transmission and human-computer interaction between the upper computer and the lower computer,and can realize corresponding different functions in different modules of the upper computer human-computer interaction software system,such as real-time update and display of dynamic curves and images,positioning and real-time control of nano macro-moving platform,PSD parameter control,etc.The AFM human-computer interaction software system in this topic adopts the integrated development environment Qt Creator,the development framework adopts the cross-platform graphical user interface application development framework Qt,and the development language is C/C++.According to the characteristics of AFM and system requirements of the lower computer,the data communication function based on TCP/IP between the upper computer and the lower computer and the realization of various functions of different modules of the upper computer are completed.The image information of AFM comes from all kinds of information generated when the cantilever beam structure probe is in contact or non-contact state with the surface of the measured sample.Photoelectric sensing technology can be used to detect the stress deformation of the probe to obtain information such as the topography characteristics of the surface of the measured sample.AFM images will be tilted and bent due to the tilt angle between the sample surface and the probe.When using the least square fitting method to carry out full image horizontal correction on AFM images,the topography structure higher or lower than the sample substrate will affect the fitting correction results.In order to realize automatic correction of different AFM images,aiming at the limitations of existing correction methods and the diversity of AFM images,an automatic marking and removal method of feature data based on image recognition is proposed.The image edge detection algorithm is used to automatically identify the feature graphics.After the region data of the feature graphics are framed and marked,the marked data are automatically removed from the row fitting data set.After completing the fitting of all rows of data,the full image data eliminating horizontal distortion can be obtained.This method can adapt to different AFM images,realize automatic fitting correction of the whole image,and improve correction accuracy and correction efficiency.