Design And Implementation Of MTM Anti-fuse FPGA Test Platform

Field Programmable Gate Array(Field Programmable Gate Array,FPGA)is a logic device commonly used in hardware development at present.It originated in the 1970 s and has become a mainstream product in the integrated circuit application market.With the continuous development of science and technology,various countries regard aerospace,military,and information and communication as their key development directions.FPGAs are used more and more frequently,and the working environment of FPGAs has become more demanding.At present,the mainstream FPGAs on the market are mostly SRAM type and FLASH type.Although these two types of FPGAs have different structures and configurations,they have some applicability in the face of external interference such as electromagnetic and radiation.Insufficient,so it cannot work for a long time in some environments.Therefore,it is necessary to choose an FPGA with the advantages of high reliability,low power consumption and strong radiation resistance to resist the interference of the external environment.The Mental electrode-Insulating medium-Metal electrode(Mental to Mental,MTM)type anti-fuse FPGA just meets this demand and is widely used.Although the MTM type anti-fuse FPGA has good reliability and anti-radiation capability,since the anti-fuse FPGA only allows one-time programming,it is very important to test the correctness of its programming.For the test of anti-fuse FPGA,both the corresponding bit stream file and the corresponding test voltage need to be provided,so it is not suitable for the current test platform on the market.Therefore,in view of this situation,this article proposes a test platform that can effectively test anti-fuse FPGAs.In the second chapter,this article introduces the basic principles of anti-fuse FPGA chips and the programming process.Based on the above research,the design requirements and design schemes of the test platform are given.The test platform is introduced from two major aspects of hardware circuit and software design.The third chapter analyzes the hardware circuit design process of the test platform,and explains the working process of the designed circuit.Chapter 4 introduces the configuration process of the USB chip used.Chapter 5 introduces the driver design of the programmer.The software part of the test platform is introduced in Chapter 6.The design of the software interface and the design of the software program are introduced.Then the example test of the test platform is explained.After the designed programmer goes through the four processes of chip selection,schematic design,PCB drawing,PCB manufacturing,and soldering,the hardware and software system is debugged,and the anti-fuse FPGA is tested with corresponding examples.Summarize and analyze the results of the example test,and judge whether the test platform meets the corresponding requirements.The seventh chapter summarizes the work of the full text,and expounds the direction of improvement and optimization after the test platform.