Study On The Mechanism Of Strong Goss Texture Formation In Low Temperature Oriented Silicon Steel Strip Containing Niobium

Grain-oriented silicon steel has the characteristics of low iron loss and high magnetic induction.It is widely used in medium and high frequency transformer cores and is an indispensable material in the power field.The orientation deviation and strength of Gaussian texture are the decisive factors for judging the magnetic properties of grainoriented silicon steel.The abnormally grown Gaussian grains are oriented accurately,and the finished product of oriented silicon steel with high magnetic properties can be obtained.In this paper,aiming at the key technology of abnormal growth of Gaussian texture of oriented silicon steel strip,the abnormal growth of Gaussian grains in the preparation process was designed and analyzed by metallographic microscope(OM)and electron backscatter diffraction(EBSD);through microscope(TEM)and scanning electron microscopy(SEM)to analyze the morphology and distribution of the inhibitors.The microstructure and grain boundary characteristics of the primary recrystallization and secondary recrystallization stages of grain-oriented silicon steel strips were studied,and the changes of abnormally grown Goss grains in ultra-thin grain-oriented silicon steel strips were understood.It is expected to provide some theoretical and experimental support for the regulation of Gaussian grains.In this paper,based on the successful preparation of grain-oriented silicon steel strip by secondary recrystallization annealing,the effects of primary recrystallization and early stage of secondary recrystallization on the growth of Goss grains are discussed.Designed the secondary cold rolling process,and successfully produced primary recrystallized and non-recrystallized oriented silicon steel strips,with a finished product thickness of 0.15 mm.Grains of grain-oriented silicon steel without primary recrystallization are fine and uniform in the initial stage of secondary recrystallization,and there are a large number of highenergy grain boundaries of 20°～45° around Goss grains.Under laboratory conditions,an ultra-thin grain-oriented silicon steel strip with a thickness of 0.1 mm was successfully prepared by one-time cold rolling process.It is recognized that Goss grains with different orientation deviations in ultra-thin strips of grain-oriented silicon steel may grow abnormally.The microstructure,texture,grain boundary,inhibitor and other related experimental data of grain-oriented silicon steel are provided,in order to control the orientation of the abnormally grown Goss grains in the finished grain-oriented silicon steel,and realize that the Goss grains with large orientation deviation do not grow abnormally during the recrystallization annealing process,and then laid the foundation for the study of its preparation process and texture evolution law.