Semiconductor Refrigeration Chip Test System Based On STM3

Semiconductor refrigeration chip is widely used,every year a large number of semiconductor refrigeration chip into use,but the semiconductor refrigeration chip device test technology can not meet the current needs,the domestic development of semiconductor refrigeration chip test instrument has many defects,and foreign imports of test instruments is expensive,so the current urgent need to meet the needs of domestic small and medium-sized manufacturers of semiconductor refrigeration chip test Therefore,there is an urgent need for an instrument to meet the testing needs of domestic small and medium-sized manufacturers of semiconductor refrigeration wafers.To address this situation,this paper designs a comprehensive inspection and testing system for semiconductor refrigeration wafers,which meets the needs of the existing domestic industrial level,is affordable,reliable and easy to operate.This paper firstly explains the working principle of the semiconductor cooler,then analyzes the defects of the traditional test method,and proposes a new test method for the semiconductor cooler on the basis of the traditional test method,and proposes the small current AC test method and DC transient method for the resistance value R and the superiority coefficient Z of the semiconductor cooler.The hardware part of the test system mainly consists of STM32 main control circuit,power supply circuit,ADC acquisition circuit,constant current source circuit,DAC voltage output circuit,invert circuit,temperature measurement circuit and signal amplification circuit,and the simulation of the circuit after designing the hardware circuit;the software part mainly cooperates with the hardware part.The software part is mainly to write the drivers of each module,and to use Labview to write the upper computer display interface.In this paper,each part of the module that may affect the accuracy of the semiconductor cooling chip test is tested and analyzed,and optimization and improvement methods are proposed,mainly the adjustable constant current source module and the ADC acquisition module,after testing,the errors of both are within the acceptable range;the accuracy,stability and repeatability of the test system are also tested in practice,and the test results show that the test system is better than the traditional although there is a certain gap between the test accuracy and foreign imported products,the design is low in cost and small in size and simpler in operation,which has a good application prospect.