XPS And UV-PL Studies On Tin Doped In Float Glass

The purpose of this work is investigating the tin element comprehensivelyin the under surface of float glass. On the basic of systemic analysis of thedevelopment of float glass technology, 5 mm rude commercial float glass wasselected as sample in this study. X-ray Photoelectron Spectroscopy (XPS)analysis was used to research the distribution of tin ions of different oxidationvalues. The excitation-emission mechanism of tin ions in float glass wasinvestigated by Ultraviolet Photoluminescence (UV-PL) analysis. While X-rayFluorescence (XRF) analysis was employed as verifying method to study theeffect of tin content on the quality of float glass. The mechanism of bloomphenomenon, as well as the quantitative measurement to indicate the tin contentin float glass, was also studied. It is concluded that, in the under surface of floatglass, tin is existed in three state, i.e. Sn⁰, Sn²⁺ and Sn⁴⁺, where the relativeproportion of Sn²⁺ is over 90% of total tin content. On the analysis of PL spectraof samples with different tin contents we found that, PL intensity of Sn2+ ion at273 nm in excitation spectra is in good linear relationship with the tin countobtained from XRF. The formula is Y=A+B×X, where A an B are constants.This result is in accord with the conclusion deduced from the theory of PLintensity and XRF intensity. This shows a new effective method of thequantitative measurement of the tin content in float glass using the PL effect oftin ion. The analysis on bloom phenomenon shows that, the expanding broughtby the oxidation of Sn²⁺ to Sn⁴⁺ in annealing process causes the cumulation ofinner stress, which leads to the happen of bloom phenomenon. The presence ofSn2+ is the origin of bloom phenomenon, while the happening of bloomphenomenon actually lies on whether the tin content in float glass surfaceexceeds the critical value of 1200 (donated with XRF cps)...