| This research addresses several concerns of the mechanisms controlling performance and lifetime of high-current single-channel-hollow-cathodes, the central electrode and primary life-limiting component in Magnetoplasmadynamic thrusters. Specifically covered are the trends, and the theorized governing mechanisms, seen in the discharge efficiency and power, the size of the plasma attachment to the cathode (the active zone), cathode exit plume plasma density and energy, along with plasma property distributions of the internal plasma column (the IPC) of a single-channel-hollow-cathode. Both experiment and computational modeling were employed in the analysis of the cathodes. Employing Tantalum and Tungsten cathodes (of 2, 6 and 10 mm inner diameter), experiments were conducted to measure the temperature profile of operating cathodes, the width of the active zone, the discharge voltage, power, plasma arc resistance and efficiency, with mass flow rates of 50 to 300 sccm of Argon, and discharge currents of 15 to 50 Amps.;Langmuir probing was used to obtain measurements for the electron temperature, plasma density and plasma potential at the cathode exit plane (down stream tip). A computational model was developed to predict the distribution of plasma inside the cathode, based upon experimentally determined boundary conditions. It was determined that the peak cathode temperature is a function of both interior cathode density and discharge current, though the location of the peak temperature is controlled gas density but not discharge current. The active zone width was found to be an increasing function of the discharge current, but a decreasing function of the mass flow rate. The width of the active zone was found to not be controlled by the magnitude of the peak cathode wall temperature. The discharge power consumed per unit of mass throughput is seen as a decreasing function of the mass flow rate, showing the increasing efficiency of the cathode. Finally, this new understanding of the mechanisms of the plasma attachment phenomena of a single-channel-hollow-cathode were extrapolated to the multi-channel-hollow-cathode environment, to explain performance characteristics of these devices seen in previous research. |
