The Study Of Sample Permittivity Measuring With AF/PSTM And SPR Technology

AF/PSTM was designed by our group. This system use a tiny probe to scan the subtle singles on the surface of a sample, which break the confine of the tradition diffraction limit and has a resolving power in nanometer dimension. In one scanning the system gets tow AFM image and two optic image respectively (a index image and a trans image), however index image is a relative value which show the difference of the index in each point not the absolute value.SPR is used for surface enhancement technique which dependent on the power coupling and the resonant of the surface plasma and the TM of the incident light. The first part of this article give a brief introduction for the development of AF/PSTM system including the AF and PSTM systems. Then give a brief presentation of the research of the system including the principle of eliminating the artifacts, the function for each part, and same examples. The second part of the article is the principle and the applications of the SPR. The third part mainly introduce our experiment. Using the AF/PSTM system together with the SPR technique, we design a Kretschmann SPR coupling equipment and the corresponding angle trimming system and measure the permittivity of the silver film according the SPR resonant peak. Then a further discussion of the possibility to achieve AF/PSTM system location of the index image through the calculated the permittivity and index of liquid.