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Research On Environment Measuring And Controlling About Facility Culture

Posted on:2006-04-22Degree:MasterType:Thesis
Country:ChinaCandidate:H G CaoFull Text:PDF
GTID:2133360155960024Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
This paper is to design an SCM system to detect and control the environment parameters in greenhouse. The system can detect and display the environment parameters like temperature and humidity of air and soil, raise the alarm when these parameters changed, and automatically adjust these parameters in greenhouse according to variable needs of the crop in different growth phases. In this paper, data collection and transform subsystem, master and slave control subsystem and dripping irrigation subsystem were designed. Data collection and transform subsystem adopts high sensitive sensing devices and signal modulation and amplifying circuits to collect the environment parameters. Slave control subsystem adopts 89C51 IC, together with A/D transfer, LED display, manipulating and driving circuit to control electromagnetism switch and fans. It receives the collected data from Data collection and transform subsystem and transmits the data to Master control subsystem, and adjust the manipulation of corresponding devices to adjust the temperature and humidity in the greenhouse automatically according to commands from Master control subsystem. Master control subsystem adopts SCM 8031 as core control unit, together with keypad, LCD display, communication port to printer, data storage device, alarm handling circuit, and the RS485 serial interface to slave subsystems. When data received, master control subsystem displays the information, compares them with standard data stored, decides whether alarms should be raised and sends command to slave control subsystem to adjust the manipulation of corresponding devices. The Dripping irrigation subsystem is used to adjust the humidity of soil according to instructions from control subsystem.Deployment of this system proves that the yield from the greenhouse is increased and the quality of the crop is improved.
Keywords/Search Tags:Environment of facilities, Measure and controlling, One-chip computer
PDF Full Text Request
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