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Grey Correlation Analysis Of Morphological Traits Related To Drought Tolerance Of Wheat At Seeding Stage And Distribution Of Lr1 Gene In Derivatives From Core Chinese Wheat Parents

Posted on:2011-06-07Degree:MasterType:Thesis
Country:ChinaCandidate:X C LiuFull Text:PDF
GTID:2143360308972015Subject:Crop Genetics and Breeding
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Grey Correlation Analysis of Morphological Traits Related to Drought Tolerance of Wheat at Seeding Stage and Distribution of Lrl gene in Derivatives from Core Chinese Wheat ParentsDrought is one of the main non-biological stress which is restricted production in the world. Drought is the main yield limiting factor in most parts of North Area, So the key road is choosing and breeding drought resistance variety. To cultivate and demonstrate good drought resistance variety has important meaning of saving water resource and evaluating wheat varieties drought resistance index exactly is the base of drought resistance wheat breeding and choosing. In this study,it aims at probing the relationship between morphological traits and drought tolerance of wheat cultivars and screening effective indexes for drought resistance. A total of 9 morphological traits including plant height, main root length, root number, shoot fresh weight, shoot dry weight, root fresh weight,root dry weight,leaf number,root/shoot ratio that measured in 28 wheat cultivars grown at laboratory drought stress by PEG-6000, were analyzed using grey relational grade. At the some time,cultivars were classified by using clustering analysis base on weight drought-tolerance coefficient. Grey correlation degrees were calculated between each trait and its drought coefficient and ranked as follows:leaf number (0.817)>plant height (0.766)>shoot dry weight (0.746)>shoot fresh weight (0.729)>root number (0.699) >root dry weight (0.688)> root fresh weight (0.681)>root/shoot ratio (0.645)>main root length (0.399). The result show that 9 morphological traits could be classified 3 categories. The cluster consequence dovetailed fundamentally with source and area distribution of cultivars.Wheat leaf rust caused by fungal pathogen (Puccinia triticina) is a severe disease worldwide that is responsible for major crop damage and results in both yield losses and down grading in quality. The use of resistance variety is the most effective, economical and ecological method to control epidemics of leaf rust disease. The leaf rust disease resistance gene 1(Lrl) is present in a number of wheat cultivars. Plants containing the Lrl resistance gene show a typical hypersensitive reaction after infection with an avirulent pathogen race. In this study,The presence of Lrl in four core wheat parents (Mentana,Funo,Yan Da 1817 and Bi Ma 4) and 328 derivatives from these parents were determined using PCR based molecular method. Frequencies of the Lr1 genes in these derivatives were:Yan Da 1817 (80%)> Funo (78.1%)> Mentana (54.2%)> BiMa 4 (32.4%). The highest frequencies of Lr1 gene in Funo derivatives is 90%(Third of Funo),The highest frequencies of Lr1 gene in Yan Da 1817derivatives is 100%(Third of Yan Da 1817),The highest frequencies of Lr1 gene in Mentana derivatives is 100%(Fifth of Mentana),The highest frequencies of Lr1 gene in Bi Ma 4 derivatives is 45%(Third of BiMa 4). Frequencies of Lr1 loci increased in the derivatives from winter wheat zones to spring winter zones.
Keywords/Search Tags:Drought coefficient, Grey correlation analysis, Cluster analysis, Lr1, Derivatives
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