| The paper introduced an experimental apple non-destructive inspection system based on fruits' dielectric properties, the method and the process of it. The dielectric parameters of inspected apple are sampled by mean of a capacitive sensor and an Inductance-Capacitance-Resistance (LCR) instrument connected with the computer in the system. We tested the dielectric parameters of the apples with different degree of decay and fresh, different figure, different status of being plunged and different time of being leaved in laboratory. We also in filled decay pulp into some high quality apples to simulate internal decay apple and tested their dielectric parameters. Then we analyzed the datum of result and make some concludes.After defined and tested a team of parameters of apple's figure, we found there are relations between the dielectric properties and the quality or the figure of the apples. From the investigation of apple's postharvest physiology, we used qualitative and quantitative analysis to probe into the influence of senescence and decay of apple on the dielectric properties. Because there are two effects of decay on dielectric, the cases of the decay were classified. Then the feasibility of using dielectric properties to evaluate apples' quality and select apples was discussed. We conclude that dielectric property parameters can be used for evaluating fruit's quality and automatically selecting fruit on line non-destructively, but we need to think about to combine machine-vision technique to improve the degree of accuracy.The paper then introduced an automatically nondestructive inspection system for apple internal quality selection based on dielectric property.At last, the paper forecasted the application foreground of nondestructive inspection system based on dielectric property with evaluation on research future. A tentative plan was put forward to establish a non-linearity matrix on the index of dielectric properties obtained by nondestructive inspection. |
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