Usb-1149.1 Boundary-scan Test Controller Design

With the printed circuit boards gradually complicated, the traditional method does not work well for testing them. It is a good technology for Boundary-Scan Test (BST) that accomplishes testing of the board-level interconnection and the on-chip system logic. For the BST system, a large number of data is required to be transferred. It's necessary for the test system that the data delivers at high speed, which can increases consumedly test efficiency. High-speed BST controller based on USB (Universal Serial Bus) can resolve this problem nicely, and it has many good properties, such as installed simply and taken the convenience.USB is a mainstream technology to provide connectivity between PC and PC peripherals, which can acquire the transfer rate of 480Mbits/sec and extend its applications to automatic measurement field to satisfy higher requirement for data transfer. For high-speed BST controller, the host communicates the controller with USB. In the controller there are two key devices: One is CY7C68013 that belongs to EZ-USB FX2, which handles USB2.0 specifications; the other is a FPGA that was developed by the laboratory of CAT, which handles IEEE1149.1 specifications. FX2 communicates with the FPGA in GPIF (general programmable interface) master mode. This design can achieve the maximum USB2.0 transfer bandwidth. The controller can run at a maximum rate of 48MHz, whose the range is 5MHz-48MHz. It provides four channels for DUT (Device Under Test), and can run stably and dependably.Chapter one introduces the background and significance about the paper.Chapter two presents the preparing knowledge on designing the controller.Chapter three demonstrates the project of designing the high-speed controller.Chapter four discusses the designing of the hardware and firmware of this controller.Chapter five gives the summary and some advices on improving the design in the future.