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Vxi Bus Modules Engineered Key Technology Research

Posted on:2013-02-13Degree:MasterType:Thesis
Country:ChinaCandidate:L L ZhouFull Text:PDF
GTID:2212330371460206Subject:Instrumentation engineering
Abstract/Summary:PDF Full Text Request
With the further research on the VXI bus technology, the hardware design of principles on VXI bus modules have been becoming mature. However,there are still many problems in reliablity technology,environment adaptability etc and urgently need to carry out engineering research.Which can provide high-quality and commercial module for weapon testing and test project.In this paper,based on the principle prototype of the VXI bus modules (VXI bus high impedance charge amplifier module, VXI bus frequency response variable amplifier module, VXI bus projectile velocity measurement module), engineering key technologies on the above three kinds of VXI bus modules are studied.Based on the analysis of struction and functional circuit on the modules, reliability block diagram and mathematic model are builded on modules. According to the stress analysis methold of component and counting methold of component, quantitative prediction of the reliablity on the modules is made,which provides the theoretical basis for formulating the follow-up of the reliability test of the scheme.The key technologies of performance tests on the three kinds of VXI bus modules are researched. According to the test requirements of performance parameters on the three kinds of VXI bus modules in the reliability test process, the testing method of the main performance indexes on three kinds of VXI bus modules are studied,and which lays the foundation of the realization of engineering on modules.Base on the theory of the reliability prediction on the three kinds of VXI bus modules, the short-term and high-risk reliability testing program is proposed, and ultimately test showes that the engineering reliability requirements on three kinds of VXI bus modules are reached.
Keywords/Search Tags:Reliability prediction, Performance parameters testing, Reliability testing, short-term and high-risk reliability testing program
PDF Full Text Request
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