The Ficudial Statistic Inference Of The Reliability Growth Test Data Of Poisson Electron Device

With the development of science and technology,more and more electronic devices in the area of literature need reliability growth test.It can judg the probability of working well.People used kinds of distributions to do the reliability analysis.These analysis wrer restricted by money,manpower and time.So we need a new analysis method to resolve it.The property possessed by Poisson distribution can shake off the shackles.It does not require observation time.This paper focuses on the reliability growth test of the type of Poisson electron device.It provides a monotone restriction model to compute the failure rate of confidence limits based on the confidence level.It has talked about the fault happened once,twice and any times.The compute of multiple fault is immensely complex,so a method of iterative to avoid the complex based on monotone restrictio model has given in this paper.In the end,the paper has a com-parison between Fiducial method and living example simulation, monotone restrictio model and AMSAA model after a large scheme of simulation test,to prove the Fiducial method is feasible and fine.It also cloud make a reference for the data analysis of reliability growth test of Poisson electron device.