Research On Test Of Semi-active Laser Seeker

The seeker is the center and cerebrum of the precision guided missile. The hit probability of weapon system directly depends on whether the operation status of the seeker is normal or not. As for this subject, an automatization test system is designed and developed for a new type of semi-active laser (SAL) seeker being developed for a project. A high-performance PIC16F877microcontrollers made by Microchip Technology Incorporated is used as the main control chip of the automatization test system. The corresponding control circuit and control software are designed based on distributed dual-CPU embedded system frame, as a result, the automatization test for the new type SAL seeker is realized.This subject is based on the function test for the seeker to make the automatic test program of the seeker designed and realized, providing a means for evaluating the seeker’s operation status. The test system can simulate the missile-borne computer to control the seeker to work as per the operation procedure of the weapon system, it can also monitor in real time and display the operation status and status parameters of the seeker. In the subject research and development, abundant interface function modules of the microprocessor like USART, I2C are used to realize control for input of function commands and output of system status parameters of the seeker system. The application test for the test system is carried out in laboratory. The detailed function test results indicate that, the system successfully realizes test for main functions and performance parameters of the SAL seeker, providing necessary means for development, adjustment&test, status evaluation and batch production inspection of the seeker.