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Research On The Fragment Measurement Of The LED Substrate And Epitaxial Patent And Countermeasures

Posted on:2013-03-18Degree:MasterType:Thesis
Country:ChinaCandidate:H L ChengFull Text:PDF
GTID:2269330422463810Subject:Intellectual property management
Abstract/Summary:PDF Full Text Request
With the environment of energy shortage, LED has becoming the main material ofbacklit display and lighting industry due to its low-power superiority. The LED substrateproduction is the cornerstone of the semiconductor industry technology which directlydetermines the manufacturing method of LED chip. The cost and scale of LED productsmanufacturing are directly related to the master of this technology. In the mode ofdevelopment-oriented innovation, technology innovation has become the key way for thedevelopment of LED substrate manufacturing enterprises. Meanwhile, the rapid upgradingof LED technology and the patent race may lead to a large number of patent thicketproblems which will result in patent dispersion situation. Therefore, measuring the LEDpatent fragment and recommending the proposed alternative patent strategy for theChinese government and enterprises, this is very important for promoting the developmentof China’s LED industry.This paper aims to investigate the patent fragment of LED substrate and epitaxialpatent and analysis the reason of this dispersion distribution in order to provide patentinformation support and reference of development direction for the development ofChinese LED enterprises. By overall grasp of the LED industry this paper focus on LEDsubstrate material produced technique and epitaxial growth technique, and use theGibbs-Martin’s patent fragment measurement index as well as mean-variance theory toexecute fragment measurement of the LED substrate considering the patent status of theLED industry. The paper conduct substrate material produced technique and epitaxialgrowth technique patent search, then China’s LED substrate production patent appeared tobe the dispersion trend over time from2003to2011by overall measurement ofGibbs-Martin’s patent fragment measurement index. By measure research according toIPC classification of segmental technology field of Chinese LED substrate productionutilizing the reverse idea of variance theory, the result shows that the H01L33/00grouphas patent concentration trend while other relevant IPC groups present significantdispersion trend. So this paper suggest that the LED substrate and epitaxial enterprisesshould execute the patent concentration strategy, through the cooperation between enterprises, business and government, as well as third-party patent operating companies ina patent centralized manner to enhance their control of the market and resilience.
Keywords/Search Tags:Light-emitting diodes, Patent fragment, Gibbs-Martin fragment index, Patentconcentration
PDF Full Text Request
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