Engineering Construction And Applications Of The New Type Of The Two-dimensional Spectrally-folded Spectrometer

In the opto-electronics field, in terms of the rich spectrum information obtained by the advanced spectrometers through the process in which photons interact with the matters in nature, optical properties of many kinds of solid materials, including macro and micro structures, can be extracted and studied, resulting in high resolution spectra to be applied in the fields of material science and engineering, information technology, bio-medical technology, environment, solar energy, remote sensing, defense and so on.Based on the opto-electron measurement and image technology, it will be required to measure and study the emission and absorption spectra of atoms and molecules in broad wavelength region with ultra-high resolution precision. In terms the spectral data obtained and analyzed in various experiment conditions, the composition and atom element in the materials, like the "finger print", can be uniquely traced and identified without any mistake.In order to achieve the spectral measurement and data analysis with high speed and high resolution in the broad spectral region, in this work, by breaking through the limitation in traditional grating and prism spectrometer design and construction, we used the advanced and two-dimensional Si-based CCD (charge-coupled device) detectors to measure the spectral distribution in its focal plane.10 sub-gratings were integrated. Then the entire spectrum in the 200-1000nm wavelength region was 10-folded and imaged on the focal plane of the CCD array detector. By solving those problems of the optical system design, soft and hardware construction, spectral calibration, and so on, the new spectrometer with a compact size was made to realize the high spectral resolution of about 0.045nm/pixel in the working spectral range. The width of the effective spectral images of about 276mm in extension in the dispersion plane was densely folded 10 times by using 10 sub-gratings that are fixed at different incidence angles. Therefore, the full spectra in the 200-1000nm wavelength region can be measured in a speed of 0.001-10s without any mechanical moving element. The advanced spectrometer studied and made in this work will have the advantage to be used for rapid spectral extraction and analysis, presenting a trend of research and development of the high performance spectrometer in the future.