The Design Of Accelerated Life Test System And Dynamic-Static Characteristic Analysis Of LED Driver

Many test data and researches indicate that LED driver is the weakest section in the whole LED system and the life of LED system is often influenced by LED driver. For long-life and high-reliability products, reliability analysis method based on failure and statistics cannot keep pace with the speed of products upgrading. As a result, this paper using reliability analysis method based on degradation designs and develops a LED driver accelerated life test system. By acquired test data and modeling for degrading processes, this paper presents a method to predict the life of LED driver. At the same time, this paper also analyzes the Dynamic-static characteristic of LED driver which is meaningful to level the reliability of LED driver.The reliability analysis method based on the degradation is presented firstly in detail. By analyzing failure mechanism of LED driver, a kind of reliability analysis method for an LED drive is proposed. Then making researches for the model commonly used in degradation processes. Component failure probabilities are calculated by the means of stress analysis.Designs and develops a LED driver accelerated life test system which can fully measure the parameters and also has the values of high-precision and being set up easily. This system uses the LED electronic load which can avoid influence of the degradation of LED chip. The LED driver system for accelerated life test provides a platform to lay the groundwork for subsequent analysis.Select the appropriate stress, develop accelerated life test program, using the accelerated life test LED driver life test system to obtain degradation data. This paper put forward a LED driver fast life prediction method using the Arrhenius accelerated life model, which based on the data at two different temperatures. So the life of LED driver at room temperature can be acquired finally.Design experiments to analyze dynamic characteristics which under two stress conditions, picture the dynamic characteristic curve and study LED driver life variation. This paper also studies the static characteristics of the SMPS circuit and the constant current source circuit chip under different bias voltages. At last, this paper analyzes the affect of luminous flux caused by degradation of LED driver. This research link the luminous flux and the electrical parameters of LED driver together.